Surface properties of microbial cells probed at the nanometre scale with atomic force microscopy

Author(s):  
C. J. P. Boonaert ◽  
P. G. Rouxhet ◽  
Y. F. Dufr�ne
Langmuir ◽  
2003 ◽  
Vol 19 (11) ◽  
pp. 4539-4543 ◽  
Author(s):  
Ahmed Touhami ◽  
Bernard Nysten ◽  
Yves F. Dufrêne

RSC Advances ◽  
2016 ◽  
Vol 6 (31) ◽  
pp. 25789-25798 ◽  
Author(s):  
Sumit Arora ◽  
Michael Kappl ◽  
Mehra Haghi ◽  
Paul M. Young ◽  
Daniela Traini ◽  
...  

l-Leucine modified voriconazole spray dried micropartcles.


mBio ◽  
2014 ◽  
Vol 5 (4) ◽  
Author(s):  
Yves F. Dufrêne

ABSTRACT Microbial cells sense and respond to their environment using their surface constituents. Therefore, understanding the assembly and biophysical properties of cell surface molecules is an important research topic. With its ability to observe living microbial cells at nanometer resolution and to manipulate single-cell surface molecules, atomic force microscopy (AFM) has emerged as a powerful tool in microbiology. Here, we survey major breakthroughs made in cell surface microbiology using AFM techniques, emphasizing the most recent structural and functional insights.


2006 ◽  
Vol 514-516 ◽  
pp. 1598-1602 ◽  
Author(s):  
Sergio Graça ◽  
Rogerio Colaço ◽  
Rui Vilar

When atomic force microscopy is used to retrieve nanomechanical surface properties of materials, unsuspected measurement and instrumentation errors may occur. In this work, some error sources are investigated and operating and correction procedures are proposed in order to maximize the accuracy of the measurements. Experiments were performed on sapphire, Ni, Co and Ni-30%Co samples. A triangular pyramidal diamond tip was used to perform indentation and scratch tests, as well as for surface visualization. It was found that nonlinearities of the z-piezo scanner, in particular the creep of the z-piezo, and errors in the determination of the real dimensions of tested areas, are critical parameters to be considered. However, it was observed that there is a critical load application rate, above which the influence of the creep of the z-piezo can be neglected. Also, it was observed that deconvolution of the tip geometry from the image of the tested area is essential to obtain accurate values of the dimensions of indentations and scratches. The application of these procedures enables minimizing the errors in nanomechanical property measurements using atomic force microscopy techniques.


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